| Originalsprache | englisch |
|---|---|
| Titel | Modern development and applications in microbeam analysis |
| Herausgeber (Verlag) | . |
| Seiten | 373-373 |
| Publikationsstatus | Veröffentlicht - 2015 |
| Veranstaltung | European Workshop on Modern Developments and Applications in Microbeam Analysis - Portoroz, Slowenien Dauer: 3 Mai 2015 → 7 Mai 2015 |
Konferenz
| Konferenz | European Workshop on Modern Developments and Applications in Microbeam Analysis |
|---|---|
| Land | Slowenien |
| Ort | Portoroz |
| Zeitraum | 3/05/15 → 7/05/15 |
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- My Favorites
- Basic - Fundamental (Grundlagenforschung)
Dies zitieren
Mitsche, S., Haberfehlner, G., Dienstleder, M., & Pölt, P. (2015). High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. in Modern development and applications in microbeam analysis (S. 373-373). ..
High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. / Mitsche, Stefan; Haberfehlner, Georg; Dienstleder, Martina; Pölt, Peter.
Modern development and applications in microbeam analysis. ., 2015. S. 373-373.Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Forschung › Begutachtung
Mitsche, S, Haberfehlner, G, Dienstleder, M & Pölt, P 2015, High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. in Modern development and applications in microbeam analysis. ., S. 373-373, Portoroz, Slowenien, 3/05/15.
Mitsche S, Haberfehlner G, Dienstleder M, Pölt P. High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. in Modern development and applications in microbeam analysis. . 2015. S. 373-373
@inproceedings{744d39006972411a85204d039282f5fc,
title = "High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy",
author = "Stefan Mitsche and Georg Haberfehlner and Martina Dienstleder and Peter P{\"o}lt",
year = "2015",
language = "English",
pages = "373--373",
booktitle = "Modern development and applications in microbeam analysis",
publisher = ".",
}
TY - GEN
T1 - High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy
AU - Mitsche, Stefan
AU - Haberfehlner, Georg
AU - Dienstleder, Martina
AU - Pölt, Peter
PY - 2015
Y1 - 2015
M3 - Conference contribution
SP - 373
EP - 373
BT - Modern development and applications in microbeam analysis
PB - .
ER -