High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelModern development and applications in microbeam analysis
Herausgeber (Verlag).
Seiten373-373
PublikationsstatusVeröffentlicht - 2015
VeranstaltungEuropean Workshop on Modern Developments and Applications in Microbeam Analysis - Portoroz, Slowenien
Dauer: 3 Mai 20157 Mai 2015

Konferenz

KonferenzEuropean Workshop on Modern Developments and Applications in Microbeam Analysis
LandSlowenien
OrtPortoroz
Zeitraum3/05/157/05/15

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • My Favorites
  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. / Mitsche, Stefan; Haberfehlner, Georg; Dienstleder, Martina; Pölt, Peter.

Modern development and applications in microbeam analysis. ., 2015. S. 373-373.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Mitsche, S, Haberfehlner, G, Dienstleder, M & Pölt, P 2015, High spatial and energy resolution x-ray analysis of thin specimens by scanning electron microscopy. in Modern development and applications in microbeam analysis. ., S. 373-373, Portoroz, Slowenien, 3/05/15.
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AU - Mitsche, Stefan

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AU - Dienstleder, Martina

AU - Pölt, Peter

PY - 2015

Y1 - 2015

M3 - Conference contribution

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BT - Modern development and applications in microbeam analysis

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