High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM

Harald Matthias Fitzek; Hartmuth Schröttner; Julian Wagner; Ferdinand Hofer; Johannes Rattenberger

doi:10.1111/jmi.12347

High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM

Harald Matthias Fitzek, Hartmuth Schröttner, Julian Wagner, Ferdinand Hofer, Johannes Rattenberger

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	85-91
Fachzeitschrift	Journal of Microscopy
Jahrgang	262
DOIs	https://doi.org/10.1111/jmi.12347
Publikationsstatus	Veröffentlicht - Jan. 2016

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Advanced Materials Science

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10.1111/jmi.12347

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High-quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM. / Fitzek, Harald Matthias ; Schröttner, Hartmuth; Wagner, Julian et al.
in: Journal of Microscopy, Jahrgang 262, 01.2016, S. 85-91.

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

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AU - Wagner, Julian

AU - Hofer, Ferdinand

AU - Rattenberger, Johannes

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