Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection

Armin Krieg; Johannes Grinschgl; Christian Steger; Reinhold Weiß; Holger Bock; Josef Haid

Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection

Armin Krieg, Johannes Grinschgl, Christian Steger, Reinhold Weiß, Holger Bock, Josef Haid

Institut für Technische Informatik (4480)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	21th IEEE Asian Test Symposium (ATS)
Herausgeber (Verlag)	.
Seiten	149-154
Publikationsstatus	Veröffentlicht - 2012
Veranstaltung	21th IEEE Asian Test Symposium - Niigata, Japan Dauer: 19 Nov. 2012 → 22 Nov. 2012

Konferenz

Konferenz	21th IEEE Asian Test Symposium
Land/Gebiet	Japan
Ort	Niigata
Zeitraum	19/11/12 → 22/11/12

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application
Experimental

1 Abgeschlossen
1 Laufend

Hardware/Software-Codesign
Steger, C., Seifert, C., Stelzer, P., Fiala, G. & Basic, F.
1/01/95 → …
Projekt: Arbeitsgebiet
PowerModes - POWer EmulatoR and MOdel based DEpendability and Security evaluation platform
Krieg, A., Grinschgl, J. & Steger, C.
1/05/10 → 31/10/12
Projekt: Forschungsprojekt

Dieses zitieren

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title = "Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection",

author = "Armin Krieg and Johannes Grinschgl and Christian Steger and Reinhold Wei{\ss} and Holger Bock and Josef Haid",

year = "2012",

language = "English",

pages = "149--154",

booktitle = "21th IEEE Asian Test Symposium (ATS)",

publisher = ".",

note = "21th IEEE Asian Test Symposium ; Conference date: 19-11-2012 Through 22-11-2012",

}

TY - GEN

T1 - Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection

AU - Krieg, Armin

AU - Grinschgl, Johannes

AU - Steger, Christian

AU - Weiß, Reinhold

AU - Bock, Holger

AU - Haid, Josef

PY - 2012

Y1 - 2012

M3 - Conference paper

SP - 149

EP - 154

BT - 21th IEEE Asian Test Symposium (ATS)

PB - .

T2 - 21th IEEE Asian Test Symposium

Y2 - 19 November 2012 through 22 November 2012

ER -

Hardware-Accelerated Workload Characterization for Power Modeling and Fault Injection

Konferenz

Fields of Expertise

Treatment code (Nähere Zuordnung)

Projekte

Hardware/Software-Codesign

PowerModes - POWer EmulatoR and MOdel based DEpendability and Security evaluation platform

Dieses zitieren