Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

Markus Neuschitzer, Armin Moser, Alfred Neuhold, Johanna Kraxner, Barbara Stadlober, Martin Oehzelt, Ingo Salzmann, Roland Resel, Jiri Novak

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalsprachedeutsch
Seiten (von - bis)1-4
FachzeitschriftJournal of applied crystallography
Jahrgang45
DOIs
PublikationsstatusVeröffentlicht - 2012

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Application
  • Experimental

Dies zitieren

Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment. / Neuschitzer, Markus; Moser, Armin; Neuhold, Alfred; Kraxner, Johanna; Stadlober, Barbara; Oehzelt, Martin; Salzmann, Ingo; Resel, Roland; Novak, Jiri.

in: Journal of applied crystallography, Jahrgang 45, 2012, S. 1-4.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Neuschitzer, Markus ; Moser, Armin ; Neuhold, Alfred ; Kraxner, Johanna ; Stadlober, Barbara ; Oehzelt, Martin ; Salzmann, Ingo ; Resel, Roland ; Novak, Jiri. / Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment. in: Journal of applied crystallography. 2012 ; Jahrgang 45. S. 1-4.
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T1 - Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

AU - Neuschitzer, Markus

AU - Moser, Armin

AU - Neuhold, Alfred

AU - Kraxner, Johanna

AU - Stadlober, Barbara

AU - Oehzelt, Martin

AU - Salzmann, Ingo

AU - Resel, Roland

AU - Novak, Jiri

PY - 2012

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DO - 10.1107/S0021889812000908

M3 - Artikel

VL - 45

SP - 1

EP - 4

JO - Journal of applied crystallography

JF - Journal of applied crystallography

SN - 0021-8898

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