Fundamentals of electron energy-loss spectroscopy

Ferdinand Hofer; Franz-Philipp Schmidt; Werner Grogger; Gerald Kothleitner

doi:10.1088/1757-899X/109/1/012007

Fundamentals of electron energy-loss spectroscopy

Ferdinand Hofer, Franz-Philipp Schmidt, Werner Grogger, Gerald Kothleitner

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.

Originalsprache	englisch
Aufsatznummer	012007
Seiten (von - bis)	1-9
Seitenumfang	9
Fachzeitschrift	IOP Conference Series: Materials Science and Engineering
Jahrgang	109
DOIs	https://doi.org/10.1088/1757-899X/109/1/012007
Publikationsstatus	Veröffentlicht - 2016

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

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10.1088/1757-899X/109/1/012007

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abstract = "Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.",

author = "Ferdinand Hofer and Franz-Philipp Schmidt and Werner Grogger and Gerald Kothleitner",

note = "Emas 2015, 14th European Workshop on Modern Development and Applications in Microbeam Analysis",

year = "2016",

doi = "10.1088/1757-899X/109/1/012007",

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AU - Grogger, Werner

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PY - 2016

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N2 - Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.

AB - Electron energy-loss spectroscopy (EELS) is an analytical technique that is based on inelastic scattering of fast electrons in a thin specimen. In a transmission electron microscope (TEM) it can provide structural and chemical information about a specimen, even down to atomic resolution. This review provides an overview of the physical basis and new developments and applications of EELS in scanning transmission electron microscopy. Recent advances in elemental mapping, spectrum imaging of plasmonic structures and quantitative analysis of atomically resolved elemental maps are highlighted.

U2 - 10.1088/1757-899X/109/1/012007

DO - 10.1088/1757-899X/109/1/012007

M3 - Article

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Fundamentals of electron energy-loss spectroscopy

Abstract

Fields of Expertise

Treatment code (Nähere Zuordnung)

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