Functional Safety Risks of Smart Power Devices due to EMI

Bernd Deutschmann; Daniel Kircher

doi:10.15488/12553

Functional Safety Risks of Smart Power Devices due to EMI

Bernd Deutschmann, Daniel Kircher

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

An important prerequisite for the safe operation of vehicles is that all electronic control units (ECUs) installed in the vehicle meet the applicable standards for functional safety and for electromagnetic compatibility. Integrated circuits (ICs) that are used within these ECUs are therefore often tested according to functional safety and EMC standards, but in most cases this is done consecutively. Therefore, we developed an extended direct power injection (DPI) test setup to characterize the functional safety and the electromagnetic interference (EMI) behavior of ICs simultaneously. Based on the results, we show that EMI can have a significant influence on the IC's functional safety behavior.

Originalsprache	englisch
Titel	Proceedings EMV Kongress 2022
Erscheinungsort	Aachen
Herausgeber (Verlag)	Apprimus Verlag
Seiten	201-207
Seitenumfang	7
DOIs	https://doi.org/10.15488/12553
Publikationsstatus	Veröffentlicht - 2022
Veranstaltung	EMV 2022 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit: EMV 2022 - Köln, Deutschland Dauer: 12 Juli 2022 → 14 Juli 2022

Konferenz

Konferenz	EMV 2022 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit
Kurztitel	EMV 2022
Land/Gebiet	Deutschland
Ort	Köln
Zeitraum	12/07/22 → 14/07/22

ASJC Scopus subject areas

Elektrotechnik und Elektronik

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10.15488/12553Lizenz: CC BY 3.0

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Verknüpfung zur Publikation in Scopus

R-MULTICHARM - Multidisziplinäre Charakterisierung & Modellierung für innovative Prozess- & Produktintegration
Radl, S., Rosenauer, P. & Deutschmann, B.
1/03/21 → 29/02/24
Projekt: Forschungsprojekt

1 Konferenz oder Fachtagung (Teilnahme an/Organisation von)
1 Vortrag bei Konferenz oder Fachtagung

Functional Safety Risks of Smart Power Devices due to EMI
Bernd Deutschmann (Redner/in) & Daniel Kircher (Redner/in)
13 Juli 2022
Aktivität: Vortrag oder Präsentation › Vortrag bei Konferenz oder Fachtagung › Science to science
EMV 2022 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit
Daniel Kircher (Teilnehmer/-in) & Bernd Deutschmann (Teilnehmer/-in)
12 Juli 2022 → 14 Juli 2022
Aktivität: Teilnahme an / Organisation von › Konferenz oder Fachtagung (Teilnahme an/Organisation von)

Dieses zitieren

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abstract = "An important prerequisite for the safe operation of vehicles is that all electronic control units (ECUs) installed in the vehicle meet the applicable standards for functional safety and for electromagnetic compatibility. Integrated circuits (ICs) that are used within these ECUs are therefore often tested according to functional safety and EMC standards, but in most cases this is done consecutively. Therefore, we developed an extended direct power injection (DPI) test setup to characterize the functional safety and the electromagnetic interference (EMI) behavior of ICs simultaneously. Based on the results, we show that EMI can have a significant influence on the IC's functional safety behavior.",

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AB - An important prerequisite for the safe operation of vehicles is that all electronic control units (ECUs) installed in the vehicle meet the applicable standards for functional safety and for electromagnetic compatibility. Integrated circuits (ICs) that are used within these ECUs are therefore often tested according to functional safety and EMC standards, but in most cases this is done consecutively. Therefore, we developed an extended direct power injection (DPI) test setup to characterize the functional safety and the electromagnetic interference (EMI) behavior of ICs simultaneously. Based on the results, we show that EMI can have a significant influence on the IC's functional safety behavior.

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BT - Proceedings EMV Kongress 2022

PB - Apprimus Verlag

CY - Aachen

T2 - 2022 International Exhibition and Conference on Electromagnetic Compatibility

Y2 - 12 July 2022 through 14 July 2022

ER -

Functional Safety Risks of Smart Power Devices due to EMI

Abstract

Konferenz

ASJC Scopus subject areas

Zugriff auf Dokument

Andere Dateien und Links

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Projekte

R-MULTICHARM - Multidisziplinäre Charakterisierung & Modellierung für innovative Prozess- & Produktintegration

Aktivitäten

Functional Safety Risks of Smart Power Devices due to EMI

EMV 2022 - Internationale Fachmesse und Kongress für Elektromagnetische Verträglichkeit

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