Full X-ray pattern analysis of vacuum deposited pentacene thin films

Oliver Werzer, B. Stadlober, A. Haase, M. Oehzelt, Roland Resel

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Originalsprache	englisch
Seiten (von - bis)	455-459
Fachzeitschrift	The European Physical Journal B
Jahrgang	66
Ausgabenummer	4
DOIs	https://doi.org/10.1140/epjb/e2008-00452-x
Publikationsstatus	Veröffentlicht - 2008

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T1 - Full X-ray pattern analysis of vacuum deposited pentacene thin films

AU - Werzer, Oliver

AU - Stadlober, B.

AU - Haase, A.

AU - Oehzelt, M.

AU - Resel, Roland

PY - 2008

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U2 - 10.1140/epjb/e2008-00452-x

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JO - The European Physical Journal B

JF - The European Physical Journal B

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