From Ontologies to Input Models for Combinatorial Testing

Publikation: KonferenzbeitragPaperForschungBegutachtung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 2018
Veranstaltung30th IFIP International Conference on Testing Software and Systems, ICTSS 2018 - Cadiz, Spanien
Dauer: 1 Okt 20183 Okt 2018

Konferenz

Konferenz30th IFIP International Conference on Testing Software and Systems, ICTSS 2018
LandSpanien
OrtCadiz
Zeitraum1/10/183/10/18

Fields of Expertise

  • Information, Communication & Computing

Dies zitieren

Wotawa, F., & Li, Y. (2018). From Ontologies to Input Models for Combinatorial Testing. Beitrag in 30th IFIP International Conference on Testing Software and Systems, ICTSS 2018, Cadiz, Spanien.

From Ontologies to Input Models for Combinatorial Testing. / Wotawa, Franz; Li, Yihao.

2018. Beitrag in 30th IFIP International Conference on Testing Software and Systems, ICTSS 2018, Cadiz, Spanien.

Publikation: KonferenzbeitragPaperForschungBegutachtung

Wotawa, F & Li, Y 2018, 'From Ontologies to Input Models for Combinatorial Testing' Beitrag in, Cadiz, Spanien, 1/10/18 - 3/10/18, .
Wotawa F, Li Y. From Ontologies to Input Models for Combinatorial Testing. 2018. Beitrag in 30th IFIP International Conference on Testing Software and Systems, ICTSS 2018, Cadiz, Spanien.
Wotawa, Franz ; Li, Yihao. / From Ontologies to Input Models for Combinatorial Testing. Beitrag in 30th IFIP International Conference on Testing Software and Systems, ICTSS 2018, Cadiz, Spanien.
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title = "From Ontologies to Input Models for Combinatorial Testing",
author = "Franz Wotawa and Yihao Li",
year = "2018",
language = "English",
note = "30th IFIP International Conference on Testing Software and Systems, ICTSS 2018 ; Conference date: 01-10-2018 Through 03-10-2018",

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