Focused diagnosis for failing Software Tests

Birgit Hofer, Seema Jehan*, Ingo Pill, Franz Wotawa

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Ranging from firmware to cloud services, software is an essential part of almost any imaginable system, or at the very least assists us in their design or maintenance. The sheer complexity and sophisticated concepts of today’s software products thus demand for solutions that assist us in assuring their quality. We aim to contribute in this direction by proposing a fault localization approach for failing test cases that draws on mode based diagnosis techniques from the AI community and focuses the search on dynamic executions. With this focus, we offer the scalability needed to consider also designs like service oriented architectures (SOAs). Furthermore, we opt for a flexible approach that allows a user to refine the reasoning by annotating our basic structure of a control flow graph with further information, e.g., for black box components. First experiments with standard software examples, as well as examples taken from the SOA domain show promising results.

Originalspracheenglisch
TitelCurrent Approaches in Applied Artificial Intelligence - 28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015, Proceedings
Redakteure/-innenChang-Hwan Lee, Yongdai Kim, Young Sig Kwon, Juntae Kim, Moonis Ali
Herausgeber (Verlag)Springer-Verlag Italia
Seiten712-721
Seitenumfang10
ISBN (Print)9783319190655
DOIs
PublikationsstatusVeröffentlicht - 1 Jan 2015
Veranstaltung28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015 - Seoul, Südkorea
Dauer: 10 Jun 201512 Jun 2015

Publikationsreihe

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Band9101
ISSN (Print)0302-9743
ISSN (elektronisch)1611-3349

Konferenz

Konferenz28th International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems, IEA/AIE 2015
LandSüdkorea
OrtSeoul
Zeitraum10/06/1512/06/15

ASJC Scopus subject areas

  • !!Theoretical Computer Science
  • !!Computer Science(all)

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