FITness Assessment - Hardware Algorithm Safety Validation

Andreas Strasser, Philipp Stelzer, Christian Steger, Norbert Druml

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband


Error correction codes (ECC) are important safety methods for digital data to gain control of single event upsets (SEU) in integrated digital circuits. SEU are responsible for single bit flips inside a digital circuit caused by ionizing radiation. This effect does not affect the physical structure of the components but the correctness of data inside flip flops. Consequently, data gets corrupted and the correct program flow gets disturbed. This effect needs to be considered especially for safety-critical systems. In the novel ISO 26262 2nd Edition, the automotive domain suggests controlling SEU effects by algorithms that correct single bit errors and detect double bit errors (SEC-DED). This raises the question what kind of impact double bit error correction (DEC) will have on the overall safety level for LiDAR systems. In this paper we determine the difference between two ECC algorithms from a safety point of view: Hamming's code (SEC-DED) and BCH-code (DEC). For this purpose we developed a novel method for algorithm safety validation and applied it to both algorithms.
TitelPerformance, Safety and Robustness in Complex Systems and Applications
UntertitelProceedings of a meeting held 24-28 March 2019, Valencia, Spain. Held at NexComm 2019
Redakteure/-innenM. R. Nejad
Herausgeber (Verlag)IARIA
ISBN (Print)9781510883734
PublikationsstatusVeröffentlicht - 24 Mär 2019
Veranstaltung9th International Conference on Performance, Safety and Robustness in Complex Systems and Applications: PESARO 2019 - Valencia, Spanien
Dauer: 24 Mär 201928 Mär 2019


Konferenz9th International Conference on Performance, Safety and Robustness in Complex Systems and Applications
KurztitelPESARO 2019


  • FIT Estimation
  • Error Correction Codes
  • LiDAR


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