FITness Assessment - Hardware Algorithm Safety Validation

Publikation: KonferenzbeitragPaperForschungBegutachtung

Abstract

Error correction codes (ECC) are important safety methods for digital data to gain control of single event upsets (SEU) in integrated digital circuits. SEU are responsible for single bit flips inside a digital circuit caused by ionizing radiation. This effect does not affect the physical structure of the components but the correctness of data inside flip flops. Consequently, data gets corrupted and the correct program flow gets disturbed. This effect needs to be considered especially for safety-critical systems. In the novel ISO 26262 2nd Edition, the automotive domain suggests controlling SEU effects by algorithms that correct single bit errors and detect double bit errors (SEC-DED). This raises the question what kind of impact double bit error correction (DEC) will have on the overall safety level for LiDAR systems. In this paper we determine the difference between two ECC algorithms from a safety point of view: Hamming's code (SEC-DED) and BCH-code (DEC). For this purpose we developed a novel method for algorithm safety validation and applied it to both algorithms.
Originalspracheenglisch
Seitenumfang6
PublikationsstatusVeröffentlicht - 24 Mär 2019
VeranstaltungThe Ninth International Conference on Performance, Safety and Robustness in Complex Systems and Applications - Valencia, Spanien
Dauer: 24 Mär 201928 Mär 2019

Konferenz

KonferenzThe Ninth International Conference on Performance, Safety and Robustness in Complex Systems and Applications
KurztitelPESARO
LandSpanien
OrtValencia
Zeitraum24/03/1928/03/19

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Schlagwörter

  • FIT Estimation
  • Error Correction Codes
  • LiDAR

Dieses zitieren

Strasser, A., Stelzer, P., Steger, C., & Druml, N. (2019). FITness Assessment - Hardware Algorithm Safety Validation. Beitrag in The Ninth International Conference on Performance, Safety and Robustness in Complex Systems and Applications, Valencia, Spanien.