Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Zhen Li; Jiang Xiao; Byongsu Seol; Jongsung Lee; David Pommerenke

doi:10.1109/ISEMC.2010.5711295

Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Zhen Li^*, Jiang Xiao, Byongsu Seol, Jongsung Lee, David Pommerenke

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.

Originalsprache	englisch
Titel	IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program
Seiten	329-333
Seitenumfang	5
DOIs	https://doi.org/10.1109/ISEMC.2010.5711295
Publikationsstatus	Veröffentlicht - 1 Dez. 2010
Extern publiziert	Ja
Veranstaltung	2010 IEEE International Symposium on Electromagnetic Compatibility: EMC 2010 - Fort Lauderdale, USA / Vereinigte Staaten Dauer: 25 Juli 2010 → 30 Juli 2010

Publikationsreihe

Name	IEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)	1077-4076

Konferenz

Konferenz	2010 IEEE International Symposium on Electromagnetic Compatibility
Land/Gebiet	USA / Vereinigte Staaten
Ort	Fort Lauderdale
Zeitraum	25/07/10 → 30/07/10

ASJC Scopus subject areas

Physik der kondensierten Materie
Elektrotechnik und Elektronik

Zugriff auf Dokument

10.1109/ISEMC.2010.5711295

Andere Dateien und Links

http://www.scopus.com/inward/record.url?scp=79952430101&partnerID=8YFLogxK

Dieses zitieren

Li, Z., Xiao, J., Seol, B., Lee, J., & Pommerenke, D. (2010). Field injection probes for field coupled electrostatic discharge sensitivity database of ICs. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program (S. 329-333). Artikel 5711295 (IEEE International Symposium on Electromagnetic Compatibility). https://doi.org/10.1109/ISEMC.2010.5711295

Field injection probes for field coupled electrostatic discharge sensitivity database of ICs. / Li, Zhen; Xiao, Jiang; Seol, Byongsu et al.
IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program. 2010. S. 329-333 5711295 (IEEE International Symposium on Electromagnetic Compatibility).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Li, Z, Xiao, J, Seol, B, Lee, J & Pommerenke, D 2010, Field injection probes for field coupled electrostatic discharge sensitivity database of ICs. in IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program., 5711295, IEEE International Symposium on Electromagnetic Compatibility, S. 329-333, 2010 IEEE International Symposium on Electromagnetic Compatibility, Fort Lauderdale, Florida, USA / Vereinigte Staaten, 25/07/10. https://doi.org/10.1109/ISEMC.2010.5711295

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title = "Field injection probes for field coupled electrostatic discharge sensitivity database of ICs",

abstract = "An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.",

author = "Zhen Li and Jiang Xiao and Byongsu Seol and Jongsung Lee and David Pommerenke",

year = "2010",

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doi = "10.1109/ISEMC.2010.5711295",

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AU - Pommerenke, David

PY - 2010/12/1

Y1 - 2010/12/1

N2 - An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.

AB - An ESD (Electrostatic Discharge) sensitivity database gives a guidance in estimating if, for a given ESD scenario and IC location soft-error (e.g., resets) problems are likely to occur or not. This paper reports on the field probes used.

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U2 - 10.1109/ISEMC.2010.5711295

DO - 10.1109/ISEMC.2010.5711295

M3 - Conference paper

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T3 - IEEE International Symposium on Electromagnetic Compatibility

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BT - IEEE International Symposium on Electromagnetic Compatibility, EMC 2010 - Final Program

T2 - 2010 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 25 July 2010 through 30 July 2010

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Field injection probes for field coupled electrostatic discharge sensitivity database of ICs

Abstract

Publikationsreihe

Konferenz

ASJC Scopus subject areas

Zugriff auf Dokument

Andere Dateien und Links

Fingerprint

Dieses zitieren