Field extraction from near field scanning for a microstrip structure

Lin Zhang, Kevin P. Slattery, Chen Wang, Masahiro Yamaguchi, Ken Ichi Arai, Richard E. DuBroff, James L. Drewniak, David Pommerenke, Todd Hubing

Publikation: Beitrag in einer FachzeitschriftArtikelBegutachtung

Abstract

Currents associated with high-speed digital device have significant impacts on EMI problems in VLSI design and operation. In this paper, a simple transmission line model was implemented as an initial step to represent the EMI mechanisms associated with an IC package. Numerical modeling results were compared with near field scanning measurements and show that the magnetic field deduced from the measurements agrees well with the numerical predictions.

Originalspracheenglisch
Aufsatznummer4
Seiten (von - bis)589-592
Seitenumfang4
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
Jahrgang2
DOIs
PublikationsstatusVeröffentlicht - 1 Jan. 2002
Extern publiziertJa

ASJC Scopus subject areas

  • Physik der kondensierten Materie
  • Elektrotechnik und Elektronik

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