FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Susanne Bauer; Werner Renhart; Oszkár Bíró

doi:10.1109/TMAG.2017.2651171

FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Susanne Bauer^*, Werner Renhart, Oszkár Bíró

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Grundlagen und Theorie der Elektrotechnik (4370)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

Originalsprache	englisch
Aufsatznummer	7812785
Fachzeitschrift	IEEE Transactions on Magnetics
Jahrgang	53
Ausgabenummer	6
DOIs	https://doi.org/10.1109/TMAG.2017.2651171
Publikationsstatus	Veröffentlicht - 1 Juni 2017

ASJC Scopus subject areas

Elektronische, optische und magnetische Materialien
Elektrotechnik und Elektronik

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10.1109/TMAG.2017.2651171

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abstract = "To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.",

keywords = "Eddy currents, electromagnetic compatibility (EMC), electrostatics, FEM",

author = "Susanne Bauer and Werner Renhart and Oszk{\'a}r B{\'i}r{\'o}",

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N2 - To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

AB - To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

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KW - electromagnetic compatibility (EMC)

KW - electrostatics

KW - FEM

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FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Abstract

ASJC Scopus subject areas

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