FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems

Susanne Bauer*, Werner Renhart, Oszkár Bíró

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

To test the immunity of an electronic devices against electrical fast transient pulses, the standardized electromagnetic compatibility measurement setup of the capacitive coupling clamp has been utilized. This paper outlines the extraction of circuit parameters with finite elements for this standardized setup. The obtained circuit parameters can be used for time saving simulations with quite common circuit simulators like LTSPICE. The simulated results are in good agreement with the measured output.

Originalspracheenglisch
Aufsatznummer7812785
FachzeitschriftIEEE Transactions on Magnetics
Jahrgang53
Ausgabenummer6
DOIs
PublikationsstatusVeröffentlicht - 1 Jun 2017

ASJC Scopus subject areas

  • !!Electronic, Optical and Magnetic Materials
  • !!Electrical and Electronic Engineering

Fingerprint Untersuchen Sie die Forschungsthemen von „FEM-Based Computation of Circuit Parameters for Testing Fast Transients for EMC Problems“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren