Fault state behavior of smart power devices during electromagnetic interference

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Abstract

In this paper the robustness of smart power ICs to electromagnetic interferences (EMI) coupled into their supply and output pins will be shown. In particular, the susceptibility of the integrated protection and diagnosis functionality will be investigated. It will be shown to what extent such devices can correctly detect fault conditions to ensure functional safety, robustness and reliability tasks, if electromagnetic interferences are coupled into their pins.

Originalspracheenglisch
Titel2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten44-49
Seitenumfang6
ISBN (elektronisch)9781509059973
DOIs
PublikationsstatusVeröffentlicht - 22 Jun 2018
Veranstaltung60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapur
Dauer: 14 Mai 201818 Mai 2018

Konferenz

Konferenz60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018
LandSingapur
OrtSuntec City
Zeitraum14/05/1818/05/18

ASJC Scopus subject areas

  • !!Aerospace Engineering
  • !!Electrical and Electronic Engineering
  • !!Safety, Risk, Reliability and Quality
  • !!Radiation

Fields of Expertise

  • Information, Communication & Computing

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