Abstract
In this paper the robustness of smart power ICs to electromagnetic interferences (EMI) coupled into their supply and output pins will be shown. In particular, the susceptibility of the integrated protection and diagnosis functionality will be investigated. It will be shown to what extent such devices can correctly detect fault conditions to ensure functional safety, robustness and reliability tasks, if electromagnetic interferences are coupled into their pins.
| Originalsprache | englisch |
|---|---|
| Titel | 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers |
| Seiten | 44-49 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9781509059973 |
| DOIs | |
| Publikationsstatus | Veröffentlicht - 2018 |
| Veranstaltung | 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 - Suntec City, Singapur Dauer: 14 Mai 2018 → 18 Mai 2018 |
Konferenz
| Konferenz | 60th IEEE International Symposium on Electromagnetic Compatibility and 9th IEEE Asia-Pacific Symposium on Electromagnetic Compatibility, EMC/APEMC 2018 |
|---|---|
| Land/Gebiet | Singapur |
| Ort | Suntec City |
| Zeitraum | 14/05/18 → 18/05/18 |
ASJC Scopus subject areas
- Luft- und Raumfahrttechnik
- Elektrotechnik und Elektronik
- Sicherheit, Risiko, Zuverlässigkeit und Qualität
- Strahlung
Fields of Expertise
- Information, Communication & Computing