Extending analytical STEM to three dimension: Spectral EELS and EDX tomography of an Al-Si based alloy

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschung

Originalspracheenglisch
TitelEuropean Workshop on Spatially-Resolved Electron Spectroscopy
Herausgeber (Verlag).
Seiten18-18
PublikationsstatusVeröffentlicht - 2014
VeranstaltungEuropean Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroupe meeting on EELS&EFTEM - TUGraz, Österreich
Dauer: 23 Apr 201425 Apr 2014

Konferenz

KonferenzEuropean Workshop on Spatially-Resolved Electron Spectroscopy & Three Country Workgroupe meeting on EELS&EFTEM
LandÖsterreich
OrtTUGraz
Zeitraum23/04/1425/04/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Extending analytical STEM to three dimension: Spectral EELS and EDX tomography of an Al-Si based alloy. / Haberfehlner, Georg; Albu, Mihaela; Orthacker, Angelina; Kothleitner, Gerald.

European Workshop on Spatially-Resolved Electron Spectroscopy. ., 2014. S. 18-18.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschung

Haberfehlner, G, Albu, M, Orthacker, A & Kothleitner, G 2014, Extending analytical STEM to three dimension: Spectral EELS and EDX tomography of an Al-Si based alloy. in European Workshop on Spatially-Resolved Electron Spectroscopy. ., S. 18-18, TUGraz, Österreich, 23/04/14.
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AU - Orthacker, Angelina

AU - Kothleitner, Gerald

PY - 2014

Y1 - 2014

M3 - Conference contribution

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