Expert system algorithms for identifying radiated emission problems in printed circuit boards

Hwan Shim; Todd Hubing; T. Van Doren; R. DuBroff; J. Drewniak; D. Pommerenke; Robert Kaires

Expert system algorithms for identifying radiated emission problems in printed circuit boards

Hwan Shim^*, Todd Hubing, T. Van Doren, R. DuBroff, J. Drewniak, D. Pommerenke, Robert Kaires

^*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel

Abstract

Radiated emission algorithms for a printed circuit board EMC expert system are described. The expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations. Working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit board looking for potentially strong radiated emission sources. Results obtained from the analysis of a sample printed circuit board are provided to demonstrate how the expert system quickly identifies problems that would otherwise be difficult to locate.

Originalsprache	englisch
Seiten (von - bis)	57-62
Seitenumfang	6
Fachzeitschrift	IEEE International Symposium on Electromagnetic Compatibility
Jahrgang	1
Publikationsstatus	Veröffentlicht - 8 Okt 2004
Extern publiziert	Ja
Veranstaltung	2004 IEEE International Symposium on Electromagnetic Compatibility: EMC 2004 - Santa Clara, USA / Vereinigte Staaten Dauer: 9 Aug 2004 → 13 Aug 2004

ASJC Scopus subject areas

!!Condensed Matter Physics
!!Electrical and Electronic Engineering

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@article{b2318796a94c40c0ba7bf64f03f5c435,

title = "Expert system algorithms for identifying radiated emission problems in printed circuit boards",

abstract = "Radiated emission algorithms for a printed circuit board EMC expert system are described. The expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations. Working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit board looking for potentially strong radiated emission sources. Results obtained from the analysis of a sample printed circuit board are provided to demonstrate how the expert system quickly identifies problems that would otherwise be difficult to locate.",

keywords = "Current-driven radiation, EMC, Expert system, Voltage-driven radiation",

author = "Hwan Shim and Todd Hubing and {Van Doren}, T. and R. DuBroff and J. Drewniak and D. Pommerenke and Robert Kaires",

year = "2004",

month = oct,

day = "8",

language = "English",

volume = "1",

pages = "57--62",

journal = "IEEE International Symposium on Electromagnetic Compatibility",

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note = "2004 IEEE International Symposium on Electromagnetic Compatibility : EMC 2004 ; Conference date: 09-08-2004 Through 13-08-2004",

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TY - JOUR

T1 - Expert system algorithms for identifying radiated emission problems in printed circuit boards

AU - Shim, Hwan

AU - Hubing, Todd

AU - Van Doren, T.

AU - DuBroff, R.

AU - Drewniak, J.

AU - Pommerenke, D.

AU - Kaires, Robert

PY - 2004/10/8

Y1 - 2004/10/8

N2 - Radiated emission algorithms for a printed circuit board EMC expert system are described. The expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations. Working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit board looking for potentially strong radiated emission sources. Results obtained from the analysis of a sample printed circuit board are provided to demonstrate how the expert system quickly identifies problems that would otherwise be difficult to locate.

AB - Radiated emission algorithms for a printed circuit board EMC expert system are described. The expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations. Working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit board looking for potentially strong radiated emission sources. Results obtained from the analysis of a sample printed circuit board are provided to demonstrate how the expert system quickly identifies problems that would otherwise be difficult to locate.

KW - Current-driven radiation

KW - EMC

KW - Expert system

KW - Voltage-driven radiation

UR - http://www.scopus.com/inward/record.url?scp=4644359856&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:4644359856

VL - 1

SP - 57

EP - 62

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

SN - 1077-4076

T2 - 2004 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 9 August 2004 through 13 August 2004

ER -

Expert system algorithms for identifying radiated emission problems in printed circuit boards

Abstract

ASJC Scopus subject areas

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