Experimental investigation of the ESD sensitivity of an 8-bit microcontroller

Lijun Han*, Jayong Koo, David Pommerenke, Daryl Beetner, Ross Carlton

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

In this paper, the susceptibility of an 8-bit microcontroller to electrostatic discharge (ESD) and electrically fast transients was tested by injecting currents through a capacitive probe into the microcontroller package pins. The reaction of the microcontroller to discharges with different rise times and polarities were investigated by measuring the voltage on the tested pins and by observing the microcontroller's clock output. Susceptibility varied significantly when injecting to one pin compared to another. Interestingly, the clock was more sensitive to currents injected into I/O pins than into pins directly related to the clock (e.g. EXTAL). Further work is underway to explain the causes of susceptibility inside the IC.

Originalspracheenglisch
TitelIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
DOIs
PublikationsstatusVeröffentlicht - 1 Dez 2007
Extern publiziertJa
VeranstaltungIEEE International Symposium on Electromagnetic Compatibility, EMC 2007 - Honolulu, HI, USA / Vereinigte Staaten
Dauer: 9 Jul 200713 Jul 2007

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076

Konferenz

KonferenzIEEE International Symposium on Electromagnetic Compatibility, EMC 2007
LandUSA / Vereinigte Staaten
OrtHonolulu, HI
Zeitraum9/07/0713/07/07

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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