Experimental evaluation of Environmental Scanning Electron Microscopes at high chamber pressure [200 - 4000 Pascal]

Publikation: KonferenzbeitragAbstractForschungBegutachtung

Originalspracheenglisch
SeitenIT-6-P-2774
PublikationsstatusVeröffentlicht - 2014
VeranstaltungInternational Microscopy Congress 2014 - Prag Tschechische Republik
Dauer: 7 Sep 201412 Sep 2014

Konferenz

KonferenzInternational Microscopy Congress 2014
OrtPrag Tschechische Republik
Zeitraum7/09/1412/09/14

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Rattenberger, J., Fitzek, H. M., Schröttner, H., Wagner, J., & Hofer, F. (2014). Experimental evaluation of Environmental Scanning Electron Microscopes at high chamber pressure [200 - 4000 Pascal]. IT-6-P-2774. Abstract von International Microscopy Congress 2014, Prag Tschechische Republik, .

Experimental evaluation of Environmental Scanning Electron Microscopes at high chamber pressure [200 - 4000 Pascal]. / Rattenberger, Johannes; Fitzek, Harald Matthias; Schröttner, Hartmuth; Wagner, Julian; Hofer, Ferdinand.

2014. IT-6-P-2774 Abstract von International Microscopy Congress 2014, Prag Tschechische Republik, .

Publikation: KonferenzbeitragAbstractForschungBegutachtung

@conference{4c08e2ac74b547398a86b34a6fcc3d12,
title = "Experimental evaluation of Environmental Scanning Electron Microscopes at high chamber pressure [200 - 4000 Pascal]",
author = "Johannes Rattenberger and Fitzek, {Harald Matthias} and Hartmuth Schr{\"o}ttner and Julian Wagner and Ferdinand Hofer",
year = "2014",
language = "English",
pages = "IT--6--P--2774",
note = "International Microscopy Congress 2014 ; Conference date: 07-09-2014 Through 12-09-2014",

}

TY - CONF

T1 - Experimental evaluation of Environmental Scanning Electron Microscopes at high chamber pressure [200 - 4000 Pascal]

AU - Rattenberger, Johannes

AU - Fitzek, Harald Matthias

AU - Schröttner, Hartmuth

AU - Wagner, Julian

AU - Hofer, Ferdinand

PY - 2014

Y1 - 2014

M3 - Abstract

SP - IT-6-P-2774

ER -