Evaluation of experimental stress-strain dependence in thermally cycled Al thin films on Si(100)

J. Keckes, M. Hafok, E. Eiper, A. Hofer, Roland Resel, C. Eisenmenger-Sittner

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)367-371
FachzeitschriftPowder diffraction
Jahrgang19
Ausgabenummer4
DOIs
PublikationsstatusVeröffentlicht - 2004

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Evaluation of experimental stress-strain dependence in thermally cycled Al thin films on Si(100). / Keckes, J.; Hafok, M.; Eiper, E.; Hofer, A.; Resel, Roland; Eisenmenger-Sittner, C.

in: Powder diffraction, Jahrgang 19, Nr. 4, 2004, S. 367-371.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Keckes, J. ; Hafok, M. ; Eiper, E. ; Hofer, A. ; Resel, Roland ; Eisenmenger-Sittner, C. / Evaluation of experimental stress-strain dependence in thermally cycled Al thin films on Si(100). in: Powder diffraction. 2004 ; Jahrgang 19, Nr. 4. S. 367-371.
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AU - Keckes, J.

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AU - Eiper, E.

AU - Hofer, A.

AU - Resel, Roland

AU - Eisenmenger-Sittner, C.

PY - 2004

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