Estimate on the uncertainty of predicting radiated emission from near-field scan caused by insufficient or inaccurate near-field data: Evaluation of the needed step size, phase accuracy and the need for all surfaces in the Huygens' box

Morten Sorensen*, Ondrej Franek, Gert Frølund Pedersen, Andriy Radchenko, Keong Kam, David Pommerenke

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Near-field scan on a Huygens' box can be used in order to predict the maximal radiated emission from a Printed Circuit Board. The significance of step size and phase accuracy, and the importance of a full Huygens' box are investigated by simulation of two different models with two different numerical methods. The prediction of maximal radiated emission is quite robust but the results also show that a full scan on all six surfaces is probably needed.

Originalspracheenglisch
TitelEMC EUROPE 2012 - International Symposium on Electromagnetic Compatibility, Proceedings
DOIs
PublikationsstatusVeröffentlicht - 1 Dez 2012
Extern publiziertJa
VeranstaltungInternational Symposium on Electromagnetic Compatibility: EMC EUROPE 2012 - Rome, Italien
Dauer: 17 Sep 201221 Sep 2012

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

KonferenzInternational Symposium on Electromagnetic Compatibility
LandItalien
OrtRome
Zeitraum17/09/1221/09/12

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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