ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

David J. Pommerenke; Thomas P. Van Doren; Wang Kai

ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

David J. Pommerenke^*, Thomas P. Van Doren, Wang Kai

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

Abstract

The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.

Originalsprache	englisch
Seiten (von - bis)	81-86
Seitenumfang	6
Fachzeitschrift	IEEE International Symposium on Electromagnetic Compatibility
Jahrgang	1
Publikationsstatus	Veröffentlicht - 1 Jan. 2002
Extern publiziert	Ja
Veranstaltung	IEEE International Symposium on Electromagnetic Compatibility: EMC 2002 - Minneapolis, USA / Vereinigte Staaten Dauer: 19 Aug. 2002 → 23 Aug. 2002

ASJC Scopus subject areas

Physik der kondensierten Materie
Elektrotechnik und Elektronik

Andere Dateien und Links

http://www.scopus.com/inward/record.url?scp=0036382265&partnerID=8YFLogxK

Dieses zitieren

@article{367f90b5c6404d978f615890768b0318,

title = "ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations",

abstract = "The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.",

keywords = "Electrostatic discharge, Susceptibility, Transient fields",

author = "Pommerenke, {David J.} and {Van Doren}, {Thomas P.} and Wang Kai",

year = "2002",

month = jan,

day = "1",

language = "English",

volume = "1",

pages = "81--86",

journal = "IEEE International Symposium on Electromagnetic Compatibility",

issn = "0190-1494",

publisher = "Institute of Electrical and Electronics Engineers",

note = "IEEE International Symposium on Electromagnetic Compatibility : EMC 2002 ; Conference date: 19-08-2002 Through 23-08-2002",

}

TY - JOUR

T1 - ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

AU - Pommerenke, David J.

AU - Van Doren, Thomas P.

AU - Kai, Wang

PY - 2002/1/1

Y1 - 2002/1/1

N2 - The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.

AB - The horizontal coupling plane (HCP) and the vertical coupling plane (VCP) are essential elements of the standardized electrostatic discharge (ESD) test. They are used for testing the robustness of equipment against indirect (nearby) discharges. This article analyzed the current and the fields on the HCP and the VCP using plane wave, transmission line, quasi-static theory. The objective is to illustrate the dominating physical processes on these planes. The work is based on measurements of the transient currents and fields using broadband sensors.

KW - Electrostatic discharge

KW - Susceptibility

KW - Transient fields

UR - http://www.scopus.com/inward/record.url?scp=0036382265&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036382265

SN - 0190-1494

VL - 1

SP - 81

EP - 86

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

T2 - IEEE International Symposium on Electromagnetic Compatibility

Y2 - 19 August 2002 through 23 August 2002

ER -

ESD currents and fields on the VCP and the HCP modeled using quasi-static approximations

Abstract

ASJC Scopus subject areas

Andere Dateien und Links

Fingerprint

Dieses zitieren