| Originalsprache | englisch |
|---|---|
| Seiten (von - bis) | 2994 |
| Fachzeitschrift | The journal of physical chemistry letters |
| Jahrgang | 7 |
| Publikationsstatus | Veröffentlicht - 2016 |
ASJC Scopus subject areas
- !!Chemistry(all)
- !!Physics and Astronomy(all)
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)
- Theoretical
- Experimental
Kooperationen
- NAWI Graz
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Hehn, I., Schuster, S., Wächter, T., Abu-Hussein, T., Zharnikov, M., & Zojer, E. (2016). Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers. The journal of physical chemistry letters , 7, 2994.
Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers. / Hehn, Iris; Schuster, Swen; Wächter, Tobias; Abu-Hussein, Tarek; Zharnikov, Michael; Zojer, Egbert.
in: The journal of physical chemistry letters , Jahrgang 7, 2016, S. 2994.Publikation: Beitrag in einer Fachzeitschrift › Artikel › Forschung › Begutachtung
Hehn, I, Schuster, S, Wächter, T, Abu-Hussein, T, Zharnikov, M & Zojer, E 2016, 'Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers' The journal of physical chemistry letters , Jg. 7, S. 2994.
Hehn I, Schuster S, Wächter T, Abu-Hussein T, Zharnikov M, Zojer E. Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers. The journal of physical chemistry letters . 2016;7:2994.
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title = "Employing X-ray Photoelectron Spectroscopy for Determining Layer Homogeneity in Mixed Polar Self-Assembled Monolayers",
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AU - Hehn, Iris
AU - Schuster, Swen
AU - Wächter, Tobias
AU - Abu-Hussein, Tarek
AU - Zharnikov, Michael
AU - Zojer, Egbert
PY - 2016
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JO - The journal of physical chemistry letters
JF - The journal of physical chemistry letters
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