Empirical Modeling of Contact Intermodulation Effect on Coaxial Connectors

Xiong Chen, Yongning He, Ming Yu, David J. Pommerenke, Jun Fan

Publikation: Beitrag in einer FachzeitschriftArtikel

Abstract

An empirical modeling of contact nonlinearity-induced intermodulation (IM) effect on the coaxial connector is presented in this article. The IM weights on inner and outer conductors are clarified using the measurement method. The contact degeneration-induced IM evolution is quantized by considering the contact coupling effect between the inner and outer conductors. This article demonstrated a set of test methods to quantify the oxide-induced nonlinearity with contact degeneration effects, and these methods can evaluate the contact IM products and further predict the low IM lifetime of passive devices
Originalspracheenglisch
Aufsatznummer8924674
Seiten (von - bis)5091-5099
Seitenumfang9
FachzeitschriftIEEE Transactions on Instrumentation and Measurement
Jahrgang69
Ausgabenummer7
DOIs
PublikationsstatusVeröffentlicht - Jul 2020

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