Electron microscopy as a tool for morphology control in nanocomposite solar cells

Wernfried Haas, Armin Zankel, Thomas Rath, Eugen Maier, Alejandro Santis Alvarez, Achim Fischereder, Gregor Trimmel, Ferdinand Hofer

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelMaterials Science
ErscheinungsortWien
Herausgeber (Verlag)Facultas
Seiten191-192
ISBN (Print)978-3-85125-062-6
DOIs
PublikationsstatusVeröffentlicht - 2009
VeranstaltungMultinational Congress on Microscopy - Graz, Österreich
Dauer: 30 Aug 20094 Sep 2009

Konferenz

KonferenzMultinational Congress on Microscopy
LandÖsterreich
OrtGraz
Zeitraum30/08/094/09/09

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Haas, W., Zankel, A., Rath, T., Maier, E., Santis Alvarez, A., Fischereder, A., ... Hofer, F. (2009). Electron microscopy as a tool for morphology control in nanocomposite solar cells. in Materials Science (S. 191-192). Wien: Facultas. https://doi.org/10.3217/978-3-85125-062-6-468

Electron microscopy as a tool for morphology control in nanocomposite solar cells. / Haas, Wernfried; Zankel, Armin; Rath, Thomas; Maier, Eugen; Santis Alvarez, Alejandro; Fischereder, Achim; Trimmel, Gregor; Hofer, Ferdinand.

Materials Science. Wien : Facultas, 2009. S. 191-192.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Haas, W, Zankel, A, Rath, T, Maier, E, Santis Alvarez, A, Fischereder, A, Trimmel, G & Hofer, F 2009, Electron microscopy as a tool for morphology control in nanocomposite solar cells. in Materials Science. Facultas, Wien, S. 191-192, Graz, Österreich, 30/08/09. https://doi.org/10.3217/978-3-85125-062-6-468
Haas W, Zankel A, Rath T, Maier E, Santis Alvarez A, Fischereder A et al. Electron microscopy as a tool for morphology control in nanocomposite solar cells. in Materials Science. Wien: Facultas. 2009. S. 191-192 https://doi.org/10.3217/978-3-85125-062-6-468
Haas, Wernfried ; Zankel, Armin ; Rath, Thomas ; Maier, Eugen ; Santis Alvarez, Alejandro ; Fischereder, Achim ; Trimmel, Gregor ; Hofer, Ferdinand. / Electron microscopy as a tool for morphology control in nanocomposite solar cells. Materials Science. Wien : Facultas, 2009. S. 191-192
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AU - Haas, Wernfried

AU - Zankel, Armin

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AU - Santis Alvarez, Alejandro

AU - Fischereder, Achim

AU - Trimmel, Gregor

AU - Hofer, Ferdinand

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