Electron microprobe analysis of(1-x)BNT-xBKT

Michael Naderer, Klaus Reichmann, Denis Schütz, Florian Mittermayr

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 24 Jul 2011
VeranstaltungThe 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials - Vancouver, Kanada
Dauer: 24 Jul 201127 Jul 2011

Konferenz

KonferenzThe 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials
LandKanada
OrtVancouver
Zeitraum24/07/1127/07/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)
  • Experimental

Dies zitieren

Naderer, M., Reichmann, K., Schütz, D., & Mittermayr, F. (2011). Electron microprobe analysis of(1-x)BNT-xBKT. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.

Electron microprobe analysis of(1-x)BNT-xBKT. / Naderer, Michael; Reichmann, Klaus; Schütz, Denis; Mittermayr, Florian.

2011. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Naderer, M, Reichmann, K, Schütz, D & Mittermayr, F 2011, 'Electron microprobe analysis of(1-x)BNT-xBKT', Vancouver, Kanada, 24/07/11 - 27/07/11, .
Naderer M, Reichmann K, Schütz D, Mittermayr F. Electron microprobe analysis of(1-x)BNT-xBKT. 2011. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.
Naderer, Michael ; Reichmann, Klaus ; Schütz, Denis ; Mittermayr, Florian. / Electron microprobe analysis of(1-x)BNT-xBKT. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.
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note = "The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials ; Conference date: 24-07-2011 Through 27-07-2011",

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T1 - Electron microprobe analysis of(1-x)BNT-xBKT

AU - Naderer, Michael

AU - Reichmann, Klaus

AU - Schütz, Denis

AU - Mittermayr, Florian

PY - 2011/7/24

Y1 - 2011/7/24

UR - http://www.sfu.ca/isaf2011/

M3 - (Old data) Lecture or Presentation

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