Originalsprache | englisch |
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Publikationsstatus | Veröffentlicht - 24 Jul 2011 |
Veranstaltung | The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials - Vancouver, Kanada Dauer: 24 Jul 2011 → 27 Jul 2011 |
Konferenz
Konferenz | The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials |
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Land | Kanada |
Ort | Vancouver |
Zeitraum | 24/07/11 → 27/07/11 |
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)
- Experimental
Dies zitieren
Naderer, M., Reichmann, K., Schütz, D., & Mittermayr, F. (2011). Electron microprobe analysis of(1-x)BNT-xBKT. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.
Electron microprobe analysis of(1-x)BNT-xBKT. / Naderer, Michael; Reichmann, Klaus; Schütz, Denis; Mittermayr, Florian.
2011. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation › Forschung
Naderer, M, Reichmann, K, Schütz, D & Mittermayr, F 2011, 'Electron microprobe analysis of(1-x)BNT-xBKT', Vancouver, Kanada, 24/07/11 - 27/07/11, .
Naderer M, Reichmann K, Schütz D, Mittermayr F. Electron microprobe analysis of(1-x)BNT-xBKT. 2011. The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials, Vancouver, Kanada.
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title = "Electron microprobe analysis of(1-x)BNT-xBKT",
author = "Michael Naderer and Klaus Reichmann and Denis Sch{\"u}tz and Florian Mittermayr",
year = "2011",
month = "7",
day = "24",
language = "English",
note = "The 20th IEEE International Symposium on Applications of Ferroelectrics International Symposium on Piezoresponse Force Microscopy & Nanoscale Phenomena in Polar Materials ; Conference date: 24-07-2011 Through 27-07-2011",
}
TY - CONF
T1 - Electron microprobe analysis of(1-x)BNT-xBKT
AU - Naderer, Michael
AU - Reichmann, Klaus
AU - Schütz, Denis
AU - Mittermayr, Florian
PY - 2011/7/24
Y1 - 2011/7/24
UR - http://www.sfu.ca/isaf2011/
M3 - (Old data) Lecture or Presentation
ER -