@article{f5f435ee99d64ee3a379fa52f138b3e8,
title = "Electrically detected magnetic resonance study of defects created by hot carrier stress at the SiC/SiO2 interface of a SiC n-channel metal-oxide-semiconductor field-effect transistor",
author = "Gernot Gruber and Peter Hadley and Markus Koch and Thomas Aichinger",
year = "2014",
doi = "10.1063/1.4891847",
language = "English",
volume = "105",
pages = "043506--043506",
journal = "Applied Physics Letters",
issn = "1077-3118 ",
publisher = "American Institute of Physics Publising LLC",
}