EELS and X-ray spectroscopic STEM imaging in 2D and 3D

Gerald Kothleitner, Georg Haberfehlner, Arno Meingast, Helen Chan, Ferdinand Hofer, Budhika Mendis

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Originalspracheenglisch
TitelEDGE 2017
SeitenT39
PublikationsstatusVeröffentlicht - 2017
VeranstaltungEnhanced Data Generated by Electrons: 8th International Workshop on Electron Energy Loss Spectroscopy and Related Techniques - Okuma Private Beach & Resort, Okuma, Okinawa, Japan
Dauer: 14 Mai 201719 Mai 2017
http://www.nims.go.jp/EDGE2017/program.html

Konferenz

KonferenzEnhanced Data Generated by Electrons
KurztitelEDGE 2017
LandJapan
OrtOkuma, Okinawa
Zeitraum14/05/1719/05/17
Internetadresse

ASJC Scopus subject areas

  • !!Materials Science(all)

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Kothleitner, G., Haberfehlner, G., Meingast, A., Chan, H., Hofer, F., & Mendis, B. (2017). EELS and X-ray spectroscopic STEM imaging in 2D and 3D. in EDGE 2017 (S. T39)

EELS and X-ray spectroscopic STEM imaging in 2D and 3D. / Kothleitner, Gerald; Haberfehlner, Georg; Meingast, Arno; Chan, Helen; Hofer, Ferdinand; Mendis, Budhika.

EDGE 2017. 2017. S. T39.

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandForschungBegutachtung

Kothleitner, G, Haberfehlner, G, Meingast, A, Chan, H, Hofer, F & Mendis, B 2017, EELS and X-ray spectroscopic STEM imaging in 2D and 3D. in EDGE 2017. S. T39, Enhanced Data Generated by Electrons, Okuma, Okinawa, Japan, 14/05/17.
Kothleitner, Gerald ; Haberfehlner, Georg ; Meingast, Arno ; Chan, Helen ; Hofer, Ferdinand ; Mendis, Budhika. / EELS and X-ray spectroscopic STEM imaging in 2D and 3D. EDGE 2017. 2017. S. T39
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AU - Mendis, Budhika

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