EELS and EDX spectroscopy for the quantitative analysis of hard metals

Lukas Konrad; Martina Lattemann; Kevin Jorissen; John Rehr; Johanna Kraxner; Daniel Knez; Angelina Orthacker; Werner Grogger; Gerald Kothleitner

EELS and EDX spectroscopy for the quantitative analysis of hard metals

Lukas Konrad, Martina Lattemann, Kevin Jorissen, John Rehr, Johanna Kraxner, Daniel Knez, Angelina Orthacker, Werner Grogger, Gerald Kothleitner

Institut für Elektronenmikroskopie und Nanoanalytik (5190)

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2015
Veranstaltung	MCM2015 - Eger, Ungarn Dauer: 23 Aug. 2015 → 28 Aug. 2015

Konferenz

Konferenz	MCM2015
Ort	Eger, Ungarn
Zeitraum	23/08/15 → 28/08/15

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Dieses zitieren

@conference{9e6193747fa0471583a8a93c2ea052e9,

title = "EELS and EDX spectroscopy for the quantitative analysis of hard metals",

author = "Lukas Konrad and Martina Lattemann and Kevin Jorissen and John Rehr and Johanna Kraxner and Daniel Knez and Angelina Orthacker and Werner Grogger and Gerald Kothleitner",

year = "2015",

language = "English",

note = "MCM2015 ; Conference date: 23-08-2015 Through 28-08-2015",

}

TY - CONF

T1 - EELS and EDX spectroscopy for the quantitative analysis of hard metals

AU - Konrad, Lukas

AU - Lattemann, Martina

AU - Jorissen, Kevin

AU - Rehr, John

AU - Kraxner, Johanna

AU - Knez, Daniel

AU - Orthacker, Angelina

AU - Grogger, Werner

AU - Kothleitner, Gerald

PY - 2015

Y1 - 2015

M3 - Poster

T2 - MCM2015

Y2 - 23 August 2015 through 28 August 2015

ER -