EDX quantification in the TEM: How to measure ζ-factors without knowing the sample thickness

Publikation: Konferenzbeitrag › Poster › Begutachtung

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2020
Veranstaltung	Virtual Early Career European Microscopy Congress 2020: EMC 2020 - Virtuell, Großbritannien / Vereinigtes Königreich Dauer: 24 Nov. 2020 → 26 Nov. 2020 https://www.emc2020.eu/virtual-conference/conference-programme.html

Konferenz	Virtual Early Career European Microscopy Congress 2020
Kurztitel	EMC 2020
Land/Gebiet	Großbritannien / Vereinigtes Königreich
Zeitraum	24/11/20 → 26/11/20
Internetadresse	https://www.emc2020.eu/virtual-conference/conference-programme.html

ASJC Scopus subject areas

@conference{9ae41ec2f7d44e29974a05be6961282f,

title = "EDX quantification in the TEM: How to measure ζ-factors without knowing the sample thickness",

author = "Nikolaus Rauch and Judith Lammer and Sebastian Rauch and Martina Dienstleder and Werner Grogger",

year = "2020",

language = "English",

note = "Virtual Early Career European Microscopy Congress 2020 : EMC 2020, EMC 2020 ; Conference date: 24-11-2020 Through 26-11-2020",

url = "https://www.emc2020.eu/virtual-conference/conference-programme.html",

}