DualBeam and analytical electron microscopy - applications in materials science

Michael Rogers, Gerald Kothleitner, Bernhard Schaffer

Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 24 Apr. 2006
Veranstaltung	2nd FEI FIB & DualBeam Userclub Meeting - Eindhoven, Niederlande Dauer: 24 Apr. 2006 → 26 Apr. 2006

Konferenz	2nd FEI FIB & DualBeam Userclub Meeting
Land/Gebiet	Niederlande
Ort	Eindhoven
Zeitraum	24/04/06 → 26/04/06

Treatment code (Nähere Zuordnung)

@conference{7ad9b2ffd01641ffa29a2206e330b853,

title = "DualBeam and analytical electron microscopy - applications in materials science",

author = "Michael Rogers and Gerald Kothleitner and Bernhard Schaffer",

year = "2006",

month = apr,

day = "24",

language = "English",

note = "2nd FEI FIB & DualBeam Userclub Meeting ; Conference date: 24-04-2006 Through 26-04-2006",

}