Dielectric Response Analysis and PD Testing for Condition Assessment of HV Bushings

Michael Krüger, Maik Koch, Gunther Kopp, Hans Michael Muhr

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	CMD
Herausgeber (Verlag)	.
Seiten	101-104
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	International Conference on Condition Monitoring and Diagnosis - Tokyo, Japan Dauer: 6 Sept. 2010 → 10 Sept. 2010

Konferenz	International Conference on Condition Monitoring and Diagnosis
Land/Gebiet	Japan
Ort	Tokyo
Zeitraum	6/09/10 → 10/09/10

Dieses zitieren

@inproceedings{6c02a29f0650489c8b8b479e0a8617cb,

title = "Dielectric Response Analysis and PD Testing for Condition Assessment of HV Bushings",

author = "Michael Kr{\"u}ger and Maik Koch and Gunther Kopp and Muhr, {Hans Michael}",

year = "2010",

language = "English",

pages = "101--104",

booktitle = "CMD",

publisher = ".",

note = "International Conference on Condition Monitoring and Diagnosis ; Conference date: 06-09-2010 Through 10-09-2010",

}

TY - GEN

T1 - Dielectric Response Analysis and PD Testing for Condition Assessment of HV Bushings

AU - Krüger, Michael

AU - Koch, Maik

AU - Kopp, Gunther

AU - Muhr, Hans Michael

PY - 2010

Y1 - 2010

M3 - Conference paper

SP - 101

EP - 104

BT - CMD

PB - .

T2 - International Conference on Condition Monitoring and Diagnosis

Y2 - 6 September 2010 through 10 September 2010

ER -