Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly

Michael Opitz, Georg Waltner, Horst Possegger, Horst Bischof

Publikation: Beitrag in Zeitung/Magazin › Artikel › Forschung › Begutachtung

Originalspracheenglisch
FachbuchIEEE Transactions on Pattern Analysis and Machine Intelligence
PublikationsstatusElektronische Veröffentlichung vor Drucklegung. - 2018

Dies zitieren

Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly. / Opitz, Michael; Waltner, Georg; Possegger, Horst; Bischof, Horst.

in: IEEE Transactions on Pattern Analysis and Machine Intelligence, 2018.

Publikation: Beitrag in Zeitung/Magazin › Artikel › Forschung › Begutachtung

Opitz, M, Waltner, G, Possegger, H & Bischof, H 2018, 'Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly' IEEE Transactions on Pattern Analysis and Machine Intelligence.
Opitz M, Waltner G, Possegger H, Bischof H. Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly. IEEE Transactions on Pattern Analysis and Machine Intelligence. 2018.
Opitz, Michael ; Waltner, Georg ; Possegger, Horst ; Bischof, Horst. / Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly. in: IEEE Transactions on Pattern Analysis and Machine Intelligence. 2018.
@misc{ce10001a3823401b8dc1045a68f85d07,
title = "Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly",
author = "Michael Opitz and Georg Waltner and Horst Possegger and Horst Bischof",
year = "2018",
language = "English",
journal = "IEEE Transactions on Pattern Analysis and Machine Intelligence",
issn = "0162-8828",
publisher = "IEEE Computer Society",

}

TY - GEN

T1 - Deep Metric Learning with BIER: Boosting Independent Embeddings Robustly

AU - Opitz, Michael

AU - Waltner, Georg

AU - Possegger, Horst

AU - Bischof, Horst

PY - 2018

Y1 - 2018

M3 - Article

JO - IEEE Transactions on Pattern Analysis and Machine Intelligence

JF - IEEE Transactions on Pattern Analysis and Machine Intelligence

SN - 0162-8828

ER -