Comparison of Simulation and Measurement of EMI-Induced Offset Voltages Occuring at Folded Cascode Operational Amplifiers

In this paper we address the simulated and mea-sured electromagnetic interference (EMI) behaviour of integrated folded cascode amplifiers. We compare the EMI-induced offset voltages at different frequencies. Therefore, we determine these EMI-induced offset voltages on the one hand by measurements and on the other hand by various simulation methods. We take different simulation variants into account, for example considering layout parasitics, package parasitics, process corners, as well as influences by the external measurement circuitry on a printed circuit board (PCB). The central topic of this work is the simulated and the measured EMI-induced offset voltage. Finally, we compare the different simulation methods with the real measurement, both in terms of offset deviation, as well as in terms of frequency deviation.