Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films

Norbert Koch, H. Oji, E. Ito, Egbert Zojer, K. Ishii, Günther Leising, K. Seki

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)764-768
FachzeitschriftApplied Surface Science
Jahrgang175-176
DOIs
PublikationsstatusVeröffentlicht - 2001

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Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films. / Koch, Norbert; Oji, H.; Ito, E.; Zojer, Egbert; Ishii, K.; Leising, Günther; Seki, K.

in: Applied Surface Science, Jahrgang 175-176, 2001, S. 764-768.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

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title = "Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films",
author = "Norbert Koch and H. Oji and E. Ito and Egbert Zojer and K. Ishii and G{\"u}nther Leising and K. Seki",
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T1 - Combined photoelectron and metastable atom electron spectroscopy study of n-doped oligophenylene thin films

AU - Koch, Norbert

AU - Oji, H.

AU - Ito, E.

AU - Zojer, Egbert

AU - Ishii, K.

AU - Leising, Günther

AU - Seki, K.

PY - 2001

Y1 - 2001

U2 - 10.1016/S0169-4332(01)00113-1

DO - 10.1016/S0169-4332(01)00113-1

M3 - Article

VL - 175-176

SP - 764

EP - 768

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -