Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	European Test Workshop
Erscheinungsort	Los Alamitos, Calif.
Herausgeber (Verlag)	IEEE Computer Soc.
Seiten	132-137
ISBN (Print)	0-7695-1908-3
DOIs	https://doi.org/10.1109/ETW.2003.1231680
Publikationsstatus	Veröffentlicht - 2003
Veranstaltung	European Test Workshop - Maastricht, Niederlande Dauer: 25 Mai 2003 → 28 Mai 2003

Fields of Expertise

@inproceedings{dc7d5df2c86e42a38309015f8efb65b4,

title = "Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967",

author = "Timm Ostermann and Bernd Deutschmann",

year = "2003",

doi = "10.1109/ETW.2003.1231680",

language = "English",

isbn = "0-7695-1908-3",

pages = "132--137",

booktitle = "European Test Workshop",

publisher = "IEEE Computer Soc.",

note = "European Test Workshop ; Conference date: 25-05-2003 Through 28-05-2003",

}

TY - GEN

T1 - Characterization of the EME of Integrated Circuits with the Help of the IEC Standard 61967

AU - Ostermann, Timm

AU - Deutschmann, Bernd

PY - 2003

Y1 - 2003

U2 - 10.1109/ETW.2003.1231680

DO - 10.1109/ETW.2003.1231680

M3 - Conference paper

SN - 0-7695-1908-3

SP - 132

EP - 137

BT - European Test Workshop

PB - IEEE Computer Soc.

CY - Los Alamitos, Calif.

T2 - European Test Workshop

Y2 - 25 May 2003 through 28 May 2003

ER -