Characterization of metal nanostructures trapped in a porousified silicon wafer

Mihaela Albu, Meltem Sezen, Toni Uusimäki, Petra Granitzer, Gerald Kothleitner, Peter Pölt, Klemens Rumpf

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 9 Mai 2011
VeranstaltungE-MRS 2011 Spring & Bilateral Meeting - Nizza, Frankreich
Dauer: 9 Mai 201113 Mai 2011

Konferenz

KonferenzE-MRS 2011 Spring & Bilateral Meeting
OrtNizza, Frankreich
Zeitraum9/05/1113/05/11

Fields of Expertise

  • Advanced Materials Science

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Albu, M., Sezen, M., Uusimäki, T., Granitzer, P., Kothleitner, G., Pölt, P., & Rumpf, K. (2011). Characterization of metal nanostructures trapped in a porousified silicon wafer. E-MRS 2011 Spring & Bilateral Meeting, Nizza, Frankreich, .

Characterization of metal nanostructures trapped in a porousified silicon wafer. / Albu, Mihaela; Sezen, Meltem; Uusimäki, Toni; Granitzer, Petra; Kothleitner, Gerald; Pölt, Peter; Rumpf, Klemens.

2011. E-MRS 2011 Spring & Bilateral Meeting, Nizza, Frankreich, .

Publikation: Konferenzbeitrag(Altdaten) Vortrag oder PräsentationForschung

Albu, M, Sezen, M, Uusimäki, T, Granitzer, P, Kothleitner, G, Pölt, P & Rumpf, K 2011, 'Characterization of metal nanostructures trapped in a porousified silicon wafer', Nizza, Frankreich, 9/05/11 - 13/05/11, .
Albu M, Sezen M, Uusimäki T, Granitzer P, Kothleitner G, Pölt P et al. Characterization of metal nanostructures trapped in a porousified silicon wafer. 2011. E-MRS 2011 Spring & Bilateral Meeting, Nizza, Frankreich, .
Albu, Mihaela ; Sezen, Meltem ; Uusimäki, Toni ; Granitzer, Petra ; Kothleitner, Gerald ; Pölt, Peter ; Rumpf, Klemens. / Characterization of metal nanostructures trapped in a porousified silicon wafer. E-MRS 2011 Spring & Bilateral Meeting, Nizza, Frankreich, .
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title = "Characterization of metal nanostructures trapped in a porousified silicon wafer",
author = "Mihaela Albu and Meltem Sezen and Toni Uusim{\"a}ki and Petra Granitzer and Gerald Kothleitner and Peter P{\"o}lt and Klemens Rumpf",
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language = "English",
note = "E-MRS 2011 Spring & Bilateral Meeting ; Conference date: 09-05-2011 Through 13-05-2011",

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T1 - Characterization of metal nanostructures trapped in a porousified silicon wafer

AU - Albu, Mihaela

AU - Sezen, Meltem

AU - Uusimäki, Toni

AU - Granitzer, Petra

AU - Kothleitner, Gerald

AU - Pölt, Peter

AU - Rumpf, Klemens

PY - 2011/5/9

Y1 - 2011/5/9

M3 - (Old data) Lecture or Presentation

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