Characterisation of typical chemical background noise in electrospray ionisation LC-MS.

Xinghua Guo, Andries P. Bruins, Thomas R. Covey

Publikation: Konferenzbeitrag › Poster

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 2005
Veranstaltung	The 53th ASMS Conference on Mass Spectrometry and Allied Topics - San Antonio, TX, USA Dauer: 5 Juni 2005 → 9 Juni 2005

Konferenz	The 53th ASMS Conference on Mass Spectrometry and Allied Topics
Ort	San Antonio, TX, USA
Zeitraum	5/06/05 → 9/06/05

Treatment code (Nähere Zuordnung)

@conference{688e49121a064d6084972e93a794aaf5,

title = "Characterisation of typical chemical background noise in electrospray ionisation LC-MS.",

author = "Xinghua Guo and Bruins, {Andries P.} and Covey, {Thomas R.}",

year = "2005",

language = "English",

note = "The 53th ASMS Conference on Mass Spectrometry and Allied Topics ; Conference date: 05-06-2005 Through 09-06-2005",

}