Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests

Publikation: KonferenzbeitragPaperForschungBegutachtung

Originalspracheenglisch
PublikationsstatusVeröffentlicht - 21 Mai 2018
Veranstaltung12th International Conference on the Properties and Applications of Dielectric Materials - Xi'an, China
Dauer: 20 Mai 201824 Mai 2018
http://www.icpadm2018.org/

Konferenz

Konferenz12th International Conference on the Properties and Applications of Dielectric Materials
KurztitelICPADM 2018
LandChina
OrtXi'an
Zeitraum20/05/1824/05/18
Internetadresse

Dies zitieren

Pischler, O., & Schichler, U. (2018). Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. Beitrag in 12th International Conference on the Properties and Applications of Dielectric Materials, Xi'an, China.

Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. / Pischler, Oliver; Schichler, Uwe.

2018. Beitrag in 12th International Conference on the Properties and Applications of Dielectric Materials, Xi'an, China.

Publikation: KonferenzbeitragPaperForschungBegutachtung

Pischler, O & Schichler, U 2018, 'Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests' Beitrag in 12th International Conference on the Properties and Applications of Dielectric Materials, Xi'an, China, 20/05/18 - 24/05/18, .
Pischler O, Schichler U. Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. 2018. Beitrag in 12th International Conference on the Properties and Applications of Dielectric Materials, Xi'an, China.
Pischler, Oliver ; Schichler, Uwe. / Challenges Resulting from the Use of Spark Gaps for Superimposed Voltage Tests. Beitrag in 12th International Conference on the Properties and Applications of Dielectric Materials, Xi'an, China.
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