Capacitance to Digital Converter Based Parallelized Multi-Channel Measurement System

Matthias Flatscher, Gerald Schwarz, Markus Neumayer, Thomas Bretterklieber

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Off-the-shelf capacitance to digital converter (CDC) are widely available application specific integrated circuits (ASIC) to build capacitive sensors. For capacitive measurement systems with an increased number of channels, the application of these CDCs is often limited due to their measurement rate. In this paper we propose a parallelized multi-channel measurement system based on off-the-shelf capacitance to digital converters. We identify possible CDCs for the use in a parallel measurement system and demonstrate the usability of the approach by means of measurement results determined on a realized prototype.
Originalspracheenglisch
TitelI2MTC 2017 Proceedings
Seiten1191-1195
Seitenumfang5
DOIs
PublikationsstatusVeröffentlicht - 2017
VeranstaltungI2MTC 2017 - IEEE International Instrumentation and Measurement Technology - Turin, Italien
Dauer: 22 Mai 201725 Mai 2017
http://2017.imtc.ieee-ims.org/

Konferenz

KonferenzI2MTC 2017 - IEEE International Instrumentation and Measurement Technology
KurztitelI2MTC
LandItalien
OrtTurin
Zeitraum22/05/1725/05/17
Internetadresse

Fingerprint Untersuchen Sie die Forschungsthemen von „Capacitance to Digital Converter Based Parallelized Multi-Channel Measurement System“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren