Calibration Method for an RF I-V Based HF RFID Impedance Measurement System

Benjamin J.B. Deutschmann*, Michael Gadringer, Richard Fischbacher, Lukas Görtschacher, Franz Amtmann, Erich Merlin, Ulrich Muehlmann, Jasmin Grosinger

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

This paper presents a novel measurement system based on the radio frequency (RF) current-voltage (I-V) method of impedance measurements, capable of providing high sensitivity over a wide range of impedance. We use this system to characterize high frequency (HF) radio frequency identification (RFID) chips. A newly developed calibration method enables us to calibrate the system using three well-known calibration standards. Besides, we estimated the accuracy of our measurement system using another set of well-known reference standards. We achieved a high accuracy (1.5%) compared with related measurement systems, which are, in general, based on vector network analyzer (VNA) measurements (3.2%). In comparison with VNA-based systems, our proposed measurement system provides a low-cost, yet accurate method of measuring HF RFID chip impedances.

Originalspracheenglisch
Titel97th ARFTG Microwave Measurement Conference
UntertitelConducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity, ARFTG 2021
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten1-4
Seitenumfang4
ISBN (elektronisch)9780738112480
ISBN (Print)978-1-6654-4794-2
DOIs
PublikationsstatusVeröffentlicht - 2021
Veranstaltung97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity: ARFTG 2021 - Virtual, Atlanta, USA / Vereinigte Staaten
Dauer: 25 Juni 202125 Juni 2021

Konferenz

Konferenz97th ARFTG Microwave Measurement Conference: Conducted and Ota Measurement Challenges for Urban, Rural and SatComm Connectivity
KurztitelARFTG 2021
Land/GebietUSA / Vereinigte Staaten
OrtVirtual, Atlanta
Zeitraum25/06/2125/06/21

Schlagwörter

  • Microwave measurement
  • Semiconductor device measurement
  • Impedance measurement
  • Measurement uncertainty
  • Calibration
  • Capacitance measurement
  • Electrical resistance measurement

ASJC Scopus subject areas

  • Instrumentierung
  • Elektrotechnik und Elektronik
  • Computernetzwerke und -kommunikation

Fields of Expertise

  • Information, Communication & Computing

Treatment code (Nähere Zuordnung)

  • Experimental

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