Broadband phase resolving spectrum analyzer measurement for EMI scanning applications

Zongyi Chen, Shubhankar Marathe, Hamed Kajbaf, Stephan Frei, David Pommerenke

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

EMI scanning application requires phase and magnitude information for the creation of equivalent radiation models and for far-field prediction. Magnitude information can be obtained using rather an inexpensive spectrum analyzer (SA). Phase-resolving instruments such as vector network analyzers (VNA) or oscilloscopes are very expensive for frequencies above 5 GHz. For this reason, this paper proposes a method that utilizes a SA for phase-resolved magnitude measurements. The basic principle is to measure the sum or difference of two signals for different phase shifts and deduct the phase from the combined output of those measurements. The phase is retrieved using an optimization procedure. It is shown that the proposed approach can recover phase deviation within 20° when using six steps of variable attenuator control voltage for the test cases between 5 and 12 GHz.

Originalspracheenglisch
Titel2015 IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
Herausgeber (Verlag)Institute of Electrical and Electronics Engineers
Seiten1278-1283
Seitenumfang6
ISBN (elektronisch)9781479966158
DOIs
PublikationsstatusVeröffentlicht - 10 Sep 2015
Extern publiziertJa
VeranstaltungIEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Deutschland
Dauer: 16 Aug 201522 Aug 2015

Publikationsreihe

NameIEEE International Symposium on Electromagnetic Compatibility
Band2015-Septmber
ISSN (Print)1077-4076
ISSN (elektronisch)2158-1118

Konferenz

KonferenzIEEE International Symposium on Electromagnetic Compatibility, EMC 2015
LandDeutschland
OrtDresden
Zeitraum16/08/1522/08/15

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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