Autumated Analysis of Submicron Particles in SEM

Peter Pölt, Mario Schmied, Thomas Brunner

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Instrumentation and Methodology
Herausgeber (Verlag)	Czechoslovak Society for Electron Microscopy
Seiten	283-284
ISBN (Print)	80-2385503-4
Publikationsstatus	Veröffentlicht - 2000
Veranstaltung	European Congress on Electron Microscopy - Brno, Tschechische Republik Dauer: 9 Juli 2000 → 14 Juli 2000

Konferenz	European Congress on Electron Microscopy
Land/Gebiet	Tschechische Republik
Ort	Brno
Zeitraum	9/07/00 → 14/07/00

Treatment code (Nähere Zuordnung)

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title = "Autumated Analysis of Submicron Particles in SEM",

author = "Peter P{\"o}lt and Mario Schmied and Thomas Brunner",

year = "2000",

language = "English",

isbn = "80-2385503-4",

pages = "283--284",

booktitle = "Instrumentation and Methodology",

publisher = "Czechoslovak Society for Electron Microscopy",

note = "European Congress on Electron Microscopy ; Conference date: 09-07-2000 Through 14-07-2000",

}

TY - GEN

T1 - Autumated Analysis of Submicron Particles in SEM

AU - Pölt, Peter

AU - Schmied, Mario

AU - Brunner, Thomas

PY - 2000

Y1 - 2000

M3 - Conference paper

SN - 80-2385503-4

SP - 283

EP - 284

BT - Instrumentation and Methodology

PB - Czechoslovak Society for Electron Microscopy

T2 - European Congress on Electron Microscopy

Y2 - 9 July 2000 through 14 July 2000

ER -