Automatic surface reconstruction using sem images based on a new computer vision approach

Stefan Scherer; Peter Werth; Axel Pinz; Andrea Tatschl; Otmar Kolednik

Automatic surface reconstruction using sem images based on a new computer vision approach

Stefan Scherer, Peter Werth, Axel Pinz, Andrea Tatschl, Otmar Kolednik

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Electron microscopy and analysis 1999
Redakteure/-innen	C. J. Kiely
Erscheinungsort	Bristol
Herausgeber (Verlag)	Institute of Physics Publ.
Seiten	107-110
Band	161
ISBN (Print)	0-7503-0577-0
Publikationsstatus	Veröffentlicht - 1999
Veranstaltung	Institute of Physics Electron Microscopy and Analysis Group Conference - Sheffield, Großbritannien / Vereinigtes Königreich Dauer: 24 Aug. 1999 → 27 Aug. 1999

Publikationsreihe

Name	Institute of Physics conference series
Herausgeber (Verlag)	Inst. of Physics Publ.

Konferenz

Konferenz	Institute of Physics Electron Microscopy and Analysis Group Conference
Land/Gebiet	Großbritannien / Vereinigtes Königreich
Ort	Sheffield
Zeitraum	24/08/99 → 27/08/99

Dieses zitieren

Automatic surface reconstruction using sem images based on a new computer vision approach. / Scherer, Stefan; Werth, Peter; Pinz, Axel et al.
Electron microscopy and analysis 1999. Hrsg. / C. J. Kiely. Band 161 Bristol: Institute of Physics Publ., 1999. S. 107-110 (Institute of Physics conference series).

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Scherer, S, Werth, P, Pinz, A, Tatschl, A & Kolednik, O 1999, Automatic surface reconstruction using sem images based on a new computer vision approach. in CJ Kiely (Hrsg.), Electron microscopy and analysis 1999. Bd. 161, Institute of Physics conference series, Institute of Physics Publ., Bristol, S. 107-110, Institute of Physics Electron Microscopy and Analysis Group Conference, Sheffield, Großbritannien / Vereinigtes Königreich, 24/08/99.

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T1 - Automatic surface reconstruction using sem images based on a new computer vision approach

AU - Scherer, Stefan

AU - Werth, Peter

AU - Pinz, Axel

AU - Tatschl, Andrea

AU - Kolednik, Otmar

PY - 1999

Y1 - 1999

M3 - Conference paper

SN - 0-7503-0577-0

VL - 161

T3 - Institute of Physics conference series

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EP - 110

BT - Electron microscopy and analysis 1999

A2 - Kiely, C. J.

PB - Institute of Physics Publ.

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T2 - Institute of Physics Electron Microscopy and Analysis Group Conference

Y2 - 24 August 1999 through 27 August 1999

ER -