Automated near-field scanning to identify resonances

Muchaidze Giorgi; Huang Wei; Jin Min; Shao Peng; Jim Drewniak; David Pommerenke

doi:10.1109/EMCEUROPE.2008.4786897

Automated near-field scanning to identify resonances

Muchaidze Giorgi^*, Huang Wei, Jin Min, Shao Peng, Jim Drewniak, David Pommerenke

^*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in einer Fachzeitschrift › Konferenzartikel › Begutachtung

Abstract

Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

Originalsprache	englisch
Aufsatznummer	4786897
Fachzeitschrift	IEEE International Symposium on Electromagnetic Compatibility
DOIs	https://doi.org/10.1109/EMCEUROPE.2008.4786897
Publikationsstatus	Veröffentlicht - 1 Jan. 2008
Extern publiziert	Ja
Veranstaltung	2008 IEEE International Symposium on Electromagnetic Compatibility: EMC 2008 - Detroit, USA / Vereinigte Staaten Dauer: 18 Aug. 2008 → 22 Aug. 2008

ASJC Scopus subject areas

Physik der kondensierten Materie
Elektrotechnik und Elektronik

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10.1109/EMCEUROPE.2008.4786897

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title = "Automated near-field scanning to identify resonances",

abstract = "Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.",

keywords = "EMI, ESD, Near field scanning, Resonance",

author = "Muchaidze Giorgi and Huang Wei and Jin Min and Shao Peng and Jim Drewniak and David Pommerenke",

year = "2008",

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doi = "10.1109/EMCEUROPE.2008.4786897",

language = "English",

journal = "IEEE International Symposium on Electromagnetic Compatibility",

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note = "2008 IEEE International Symposium on Electromagnetic Compatibility : EMC 2008 ; Conference date: 18-08-2008 Through 22-08-2008",

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TY - JOUR

T1 - Automated near-field scanning to identify resonances

AU - Giorgi, Muchaidze

AU - Wei, Huang

AU - Min, Jin

AU - Peng, Shao

AU - Drewniak, Jim

AU - Pommerenke, David

PY - 2008/1/1

Y1 - 2008/1/1

N2 - Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

AB - Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

KW - EMI

KW - ESD

KW - Near field scanning

KW - Resonance

UR - http://www.scopus.com/inward/record.url?scp=63549126908&partnerID=8YFLogxK

U2 - 10.1109/EMCEUROPE.2008.4786897

DO - 10.1109/EMCEUROPE.2008.4786897

M3 - Conference article

AN - SCOPUS:63549126908

SN - 1077-4076

JO - IEEE International Symposium on Electromagnetic Compatibility

JF - IEEE International Symposium on Electromagnetic Compatibility

M1 - 4786897

T2 - 2008 IEEE International Symposium on Electromagnetic Compatibility

Y2 - 18 August 2008 through 22 August 2008

ER -

Automated near-field scanning to identify resonances

Abstract

ASJC Scopus subject areas

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