Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.
|Fachzeitschrift||IEEE International Symposium on Electromagnetic Compatibility|
|Publikationsstatus||Veröffentlicht - 1 Jan 2008|
|Veranstaltung||2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, USA / Vereinigte Staaten|
Dauer: 18 Aug 2008 → 22 Aug 2008
ASJC Scopus subject areas
- !!Condensed Matter Physics
- !!Electrical and Electronic Engineering