Automated near-field scanning to identify resonances

Muchaidze Giorgi*, Huang Wei, Jin Min, Shao Peng, Jim Drewniak, David Pommerenke

*Korrespondierende/r Autor/in für diese Arbeit

Publikation: Beitrag in einer FachzeitschriftKonferenzartikel

Abstract

Near-field scanning systems are a tool for rootcause ESD, EMI, and immunity analysis of electronic systems, as well as qualification methodology for ICs and modules. For emissions, they have developed into a standardized method. Development of universally accepted file formats for data exchange is on-going. Four main types of scanning have been implemented by this and other authors: Near-field EMI scanning, ESD scanning, radiated immunity scanning, and resonance scanning. This article concentrates on resonance scanning as a newly added method for automated EMC system analysis.

Originalspracheenglisch
Aufsatznummer4786897
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
DOIs
PublikationsstatusVeröffentlicht - 1 Jan 2008
Extern publiziertJa
Veranstaltung2008 IEEE International Symposium on Electromagnetic Compatibility, EMC 2008 - Detroit, USA / Vereinigte Staaten
Dauer: 18 Aug 200822 Aug 2008

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

Fingerprint Untersuchen Sie die Forschungsthemen von „Automated near-field scanning to identify resonances“. Zusammen bilden sie einen einzigartigen Fingerprint.

Dieses zitieren