Atom probe analysis of passive films on iron

G. Bauer; Manfred Leisch

doi:10.1051/jphyscol:1986734

Atom probe analysis of passive films on iron

G. Bauer, Manfred Leisch

Institut für Festkörperphysik (5130)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

Depth profiling analysis was performed for passive oxide films grown on pure iron specimens to determine the composition of the films and the interface regions. The thickness of the films as a function of applied potential and time of passivation was determined in order to get information on the kinetics of oxide growth. Benzotriazole commonly used as a corrosion inhibitor was added to the buffer solution to act as a tracer in the investigation of the mechanism of oxide growth.

Originalsprache	englisch
Seiten (von - bis)	189-195
Fachzeitschrift	Journal De Physique, III
Jahrgang	47
Ausgabenummer	C7
DOIs	https://doi.org/10.1051/jphyscol:1986734
Publikationsstatus	Veröffentlicht - 1986

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Application
Experimental

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10.1051/jphyscol:1986734

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title = "Atom probe analysis of passive films on iron",

abstract = "Depth profiling analysis was performed for passive oxide films grown on pure iron specimens to determine the composition of the films and the interface regions. The thickness of the films as a function of applied potential and time of passivation was determined in order to get information on the kinetics of oxide growth. Benzotriazole commonly used as a corrosion inhibitor was added to the buffer solution to act as a tracer in the investigation of the mechanism of oxide growth.",

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U2 - 10.1051/jphyscol:1986734

DO - 10.1051/jphyscol:1986734

M3 - Article

SN - 1286-4897

VL - 47

SP - 189

EP - 195

JO - Journal De Physique, III

JF - Journal De Physique, III

IS - C7

ER -

Atom probe analysis of passive films on iron

Abstract

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