Abstract
This paper presents the utilization of the emission source microscopy (ESM) technique to localize active sources of radiation on a PCB. For complex and large systems with multiple sources, localizing the sources of radiation often proves difficult. Near-field scanning provides limited information about the components contributing to far-field radiation. Two-dimensional synthetic aperture radar, a well-known technique used to diagnose and align phase array antennas, is adapted as emission source microscopy and utilized here for this alternative application. This paper presents the source localization methodology, along with simulation and measurement results. The results show that the proposed method can detect multiple active sources on a complex PCB.
Originalsprache | englisch |
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Titel | 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) |
Seiten | 7-11 |
Seitenumfang | 5 |
DOIs | |
Publikationsstatus | Veröffentlicht - 15 Sept. 2014 |
Extern publiziert | Ja |
Veranstaltung | 2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, USA / Vereinigte Staaten Dauer: 3 Aug. 2014 → 8 Aug. 2014 |
Konferenz
Konferenz | 2014 IEEE International Symposium on Electromagnetic Compatibility |
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Land/Gebiet | USA / Vereinigte Staaten |
Ort | Raleigh |
Zeitraum | 3/08/14 → 8/08/14 |
ASJC Scopus subject areas
- Physik der kondensierten Materie
- Elektrotechnik und Elektronik