Application of emission source microscopy technique to EMI source localization above 5 GHz

Pratik Maheshwari, Victor Khilkevich, David Pommerenke, Hamed Kajbaf, Jin Min

Publikation: Beitrag in einer FachzeitschriftKonferenzartikel

Abstract

This paper presents the utilization of the emission source microscopy (ESM) technique to localize active sources of radiation on a PCB. For complex and large systems with multiple sources, localizing the sources of radiation often proves difficult. Near-field scanning provides limited information about the components contributing to far-field radiation. Two-dimensional synthetic aperture radar, a well-known technique used to diagnose and align phase array antennas, is adapted as emission source microscopy and utilized here for this alternative application. This paper presents the source localization methodology, along with simulation and measurement results. The results show that the proposed method can detect multiple active sources on a complex PCB.

Originalspracheenglisch
Aufsatznummer6898933
Seiten (von - bis)7-11
Seitenumfang5
FachzeitschriftIEEE International Symposium on Electromagnetic Compatibility
Jahrgang2014-September
AusgabenummerSeptember
DOIs
PublikationsstatusVeröffentlicht - 15 Sep 2014
Extern publiziertJa
Veranstaltung2014 IEEE International Symposium on Electromagnetic Compatibility: EMC 2014 - Raleigh, USA / Vereinigte Staaten
Dauer: 3 Aug 20148 Aug 2014

ASJC Scopus subject areas

  • !!Condensed Matter Physics
  • !!Electrical and Electronic Engineering

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