Application and limits of IC and PCB scanning methods for immunity analysis

David Pommerenke*, Giorgi Muchaidze, Jayong Koo, Qing Cai, Jin Min

*Korrespondierende/r Autor/-in für diese Arbeit

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem KonferenzbandBegutachtung

Abstract

Immunity scanning methods can be used to locate sensitive areas on PCBs and ICs. For the analysis of emissions near field scanning is used to determine the local field strength. Both methods have many similarities and differences. For both methods it is difficult to correlate between board level scanning and system level test results as neither method shows the coupling path directly. The paper shows the implementation of an immunity scanning system and analyzes the advantages and limitations of immunity near field scanning.

Originalspracheenglisch
TitelProceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC
Seiten83-86
Seitenumfang4
DOIs
PublikationsstatusVeröffentlicht - 1 Dez. 2007
Extern publiziertJa
Veranstaltung18th International Zurich Symposium on Electromagnetic Compatibility: EMC 2007 - Munich, Deutschland
Dauer: 24 Sept. 200728 Sept. 2007

Publikationsreihe

NameProceedings of the 18th International Zurich Symposium on Electromagnetic Compatibility, EMC

Konferenz

Konferenz18th International Zurich Symposium on Electromagnetic Compatibility
Land/GebietDeutschland
OrtMunich
Zeitraum24/09/0728/09/07

ASJC Scopus subject areas

  • Elektrotechnik und Elektronik

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