Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement

Stefan Mitsche, Peter Pölt, Julian Wagner

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

Originalspracheenglisch
Seiten (von - bis)282-288
FachzeitschriftScanning
Jahrgang28
PublikationsstatusVeröffentlicht - 2006

Treatment code (Nähere Zuordnung)

  • Basic - Fundamental (Grundlagenforschung)

Dies zitieren

Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement. / Mitsche, Stefan; Pölt, Peter; Wagner, Julian.

in: Scanning, Jahrgang 28, 2006, S. 282-288.

Publikation: Beitrag in einer FachzeitschriftArtikelForschungBegutachtung

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title = "Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement",
author = "Stefan Mitsche and Peter P{\"o}lt and Julian Wagner",
year = "2006",
language = "English",
volume = "28",
pages = "282--288",
journal = "Scanning",
issn = "0161-0457",
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T1 - Analysis of Submicron Particles by Scanning Electron Microscopy-Energy-Dispersive X-ray Spectrometry—Accuracy of Size Measurement

AU - Mitsche, Stefan

AU - Pölt, Peter

AU - Wagner, Julian

PY - 2006

Y1 - 2006

M3 - Article

VL - 28

SP - 282

EP - 288

JO - Scanning

JF - Scanning

SN - 0161-0457

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