Analysis of CPU Loading Effect on ESD Susceptibility

Omid Hoseini Izadi, Hideki Shumiya, Shota Konno, Kenji Araki, David Johannes Pommerenke, DongHyun Kim

Publikation: Beitrag in Buch/Bericht/KonferenzbandBeitrag in einem Konferenzband

Abstract

Two complementary approaches are presented to help to understand how CPU loading affects the sensitivity of an electronic device to ESD (electrostatic discharge) stress. Both approaches rely on synchronized noise injection while the software is running at the desired load. One of the approaches monitors the device's current consumption while the other monitors the device's electromagnetic field to synchronize noise injections. These approaches revealed that as the CPU loading increases, the device becomes more active and hence more susceptible to ESD stress. Moreover, it was observed that, in each loading condition, the device randomly became susceptible. These complementary approaches enable the capturing of high/low active intervals as well as the injection of noise voltage to the desired activity, thus, allowing for the analysis of the effect of CPU loading on ESD susceptibility.
Originalspracheenglisch
Titel2020 IEEE International Symposium on Electromagnetic Compatibility and Signal/Power Integrity, EMCSI 2020
Seiten671-675
Seitenumfang5
ISBN (elektronisch)978-1-7281-7430-3
DOIs
PublikationsstatusVeröffentlicht - Jul 2020
Veranstaltung2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity: EMCSI 2020 - Virtual, Reno, USA / Vereinigte Staaten
Dauer: 27 Jul 202031 Jul 2020

Konferenz

Konferenz2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity
KurztitelEMCSI 2020
LandUSA / Vereinigte Staaten
OrtVirtual, Reno
Zeitraum27/07/2031/07/20

ASJC Scopus subject areas

  • !!Information Systems and Management
  • !!Safety, Risk, Reliability and Quality
  • !!Signal Processing
  • !!Radiation
  • !!Electrical and Electronic Engineering

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