An XPS and ISS investigation of oxide film formation on alloys by thermal, electrochemical and plasma oxidation

Robert Schennach, S Promreuk, D.G. Naugle, David L Cocke

Publikation: Konferenzbeitrag › (Altdaten) Vortrag oder Präsentation

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 14 Juni 1999
Veranstaltung	Surface Analysis ’99, 21st Annual Symposium on Applied Surface Analysis - Waukesha, WI, USA / Vereinigte Staaten Dauer: 14 Juni 1999 → 17 Juni 1999

Konferenz	Surface Analysis ’99, 21st Annual Symposium on Applied Surface Analysis
Land/Gebiet	USA / Vereinigte Staaten
Ort	Waukesha, WI
Zeitraum	14/06/99 → 17/06/99

Treatment code (Nähere Zuordnung)

@conference{906ad52014624a19b72d428770f610f0,

title = "An XPS and ISS investigation of oxide film formation on alloys by thermal, electrochemical and plasma oxidation",

author = "Robert Schennach and S Promreuk and D.G. Naugle and Cocke, {David L}",

year = "1999",

month = jun,

day = "14",

language = "English",

note = "Surface Analysis {\textquoteright}99, 21st Annual Symposium on Applied Surface Analysis ; Conference date: 14-06-1999 Through 17-06-1999",

}

TY - CONF

T1 - An XPS and ISS investigation of oxide film formation on alloys by thermal, electrochemical and plasma oxidation

AU - Schennach, Robert

AU - Promreuk, S

AU - Naugle, D.G.

AU - Cocke, David L

PY - 1999/6/14

Y1 - 1999/6/14

M3 - (Old data) Lecture or Presentation

T2 - Surface Analysis ’99, 21st Annual Symposium on Applied Surface Analysis

Y2 - 14 June 1999 through 17 June 1999

ER -